Efficient functional coverage test for HDL descriptions at RTL

Chien-Nan Liu*, Jing Yang Jou

*Corresponding author for this work

研究成果: Paper同行評審

4 引文 斯高帕斯(Scopus)

摘要

Until now, simulation is still the primary approach for the functional verification of RTL circuit descriptions written in HDL. The FSM coverage test can find all bugs in a FSM design. However, it is impractical for large designs because of the state explosion problem. In this paper, we modify the higher level FSM models used in other applications to replace the FSM model in the FSM coverage test. The STGs can be significantly reduced in this model so that the complexity of the test becomes acceptable even for large designs. This model can be easily extracted from the original HDL code automatically with little computation overhead. The experimental results show that it is indeed a promising functional test for FSMs.

原文English
頁面325-327
頁數3
DOIs
出版狀態Published - 1 十二月 1999
事件International Conference on Computer Design (ICCD'99) - Austin, TX, USA
持續時間: 10 十月 199913 十月 1999

Conference

ConferenceInternational Conference on Computer Design (ICCD'99)
城市Austin, TX, USA
期間10/10/9913/10/99

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