Effects of Plasma Charging Damage on the Noise Performance of Thin-Oxide MOSFET's

Z. J. Ma, H. Shin, P. K. Ko, Chen-Ming Hu

研究成果: Article同行評審

11 引文 斯高帕斯(Scopus)

指紋 深入研究「Effects of Plasma Charging Damage on the Noise Performance of Thin-Oxide MOSFET's」主題。共同形成了獨特的指紋。

Chemical Compounds

Engineering & Materials Science