EFFECTS OF AVALANCHE INJECTION CURRENTS ON THE ENDURANCE OF Si MOS DEVICES.

Chih Tang Sah*, Jach Yuan Chen Sun, Josheph Jeng Tao Tzou

*Corresponding author for this work

研究成果: Conference article同行評審

2 引文 斯高帕斯(Scopus)
原文English
頁(從 - 到)753
頁數1
期刊Technical Digest - International Electron Devices Meeting
DOIs
出版狀態Published - 1982

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