Effect of annealing temperature on physical and electrical properties of Bi3.25La0.75Ti3O12 thin films on Al2O3-buffered Si

Chia Liang Sun*, San-Yuan Chen, Shi Bai Chen, Albert Chin

*Corresponding author for this work

研究成果: Article同行評審

44 引文 斯高帕斯(Scopus)

指紋 深入研究「Effect of annealing temperature on physical and electrical properties of Bi<sub>3.25</sub>La<sub>0.75</sub>Ti<sub>3</sub>O<sub>12</sub> thin films on Al<sub>2</sub>O<sub>3</sub>-buffered Si」主題。共同形成了獨特的指紋。

Physics & Astronomy