Dual greedy: Adaptive garbage collection for page-mapping solid-state disks

Wen Huei Lin*, Li-Pin Chang

*Corresponding author for this work

研究成果: Conference contribution同行評審

25 引文 斯高帕斯(Scopus)

摘要

In the recent years, commodity solid-state disks have started adopting powerful controllers and implemented page-level mapping for flash management. However, many of these models still use primitive garbage-collection algorithms, because prior approaches do not scale up with the dramatic increase of flash capacity. This study introduces Dual Greedy for garbage collection in page-level mapping. Dual Greedy identifies page-accurate data hotness using only block-level information, and adaptively switches its preference of victim selection between block space utilization and block stability. It can run in constant time and use very limited RAM space. Our experimental results show that Dual Greedy outperforms existing approaches in terms of garbage-collection overhead, especially with large flash blocks.

原文English
主出版物標題Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 2012
頁面117-122
頁數6
DOIs
出版狀態Published - 24 五月 2012
事件15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012 - Dresden, Germany
持續時間: 12 三月 201216 三月 2012

出版系列

名字Proceedings -Design, Automation and Test in Europe, DATE
ISSN(列印)1530-1591

Conference

Conference15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012
國家Germany
城市Dresden
期間12/03/1216/03/12

指紋 深入研究「Dual greedy: Adaptive garbage collection for page-mapping solid-state disks」主題。共同形成了獨特的指紋。

引用此