Domain structure study of SrBi 2 Ta 2 O 9 ferroelectric thin films by scanning capacitance microscopy

Ching Chich Leu*, Chih Yuan Chen, Chao-Hsin Chien, Mao Nan Chang, Fan Yi Hsu, Chen Ti Hu

*Corresponding author for this work

研究成果: Article同行評審

68 引文 斯高帕斯(Scopus)

摘要

The domain structure study of SrBi 2 Ta 2 O 9 ferroelectric thin films using scanning capacitance microscopy was presented. A sharp image contrast was found to be induced between the nanosized domains owing to the various polarities. The analysis showed that the reversal polarization process of a ferroelectric domain was found to be much easier inside a large grain than in a small grain.

原文English
頁(從 - 到)3493-3495
頁數3
期刊Applied Physics Letters
82
發行號20
DOIs
出版狀態Published - 19 五月 2003

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