Dielectric properties of CdxZn1-xTe epilayers

K. F. Wang, S. P. Fu, Y. F. Chen*, J. L. Shen, Wu-Ching Chou

*Corresponding author for this work

研究成果: Article同行評審

4 引文 斯高帕斯(Scopus)

摘要

A report on the dielectric properties of CdxZn1-xTe epilayers was presented. The dielectric properties were studied by capacitance and dissipation factor measurements at temperature 201 K<T<460 K and frequency 20 Hz<f<1 MHz. It was found that the activation energy decreases with increasing Cd content.

原文English
頁(從 - 到)3371-3375
頁數5
期刊Journal of Applied Physics
94
發行號5
DOIs
出版狀態Published - 1 九月 2003

指紋 深入研究「Dielectric properties of Cd<sub>x</sub>Zn<sub>1-x</sub>Te epilayers」主題。共同形成了獨特的指紋。

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