Diagnostic test-pattern generation targeting open-segment defects and its diagnosis flow

Y. H. Chen*, C. L. Chang, C. H.P. Wen

*Corresponding author for this work

研究成果: Article同行評審

10 引文 斯高帕斯(Scopus)

指紋 深入研究「Diagnostic test-pattern generation targeting open-segment defects and its diagnosis flow」主題。共同形成了獨特的指紋。

Engineering & Materials Science