Developing a microspectrophotometer to measure the dependence of broadband refractive indices on Ge-doped concentrations in GRIN rods

Chun Jen Weng, Ken-Yuh Hsu, Cheng Yeh Lee, Yung-Fu Chen

研究成果: Article同行評審

2 引文 斯高帕斯(Scopus)

摘要

A confocal microspectrophotometer is utilized to scan the surface reflectivities of a polished gradient-index (GRIN) rod in the range of 400 to 900 nm. The pure fused silica is used to be a reference standard for deducing the absolute reflectivities of the Ge-doped core. Then, multiwavelength refractive index profiles of the Ge-doped core can be further determined based on the Fresnel equation. Moreover, this work shows a connection between the material dispersion of the GRIN rod and the Gedoped concentrations measured by an energy dispersive spectrometer. Finally, the dependence of the refractive index of the Ge-doped core on the doping concentrations at a certain wavelength can be easily expressed as a linear form.

原文English
頁(從 - 到)30815-30820
頁數6
期刊Optics Express
23
發行號24
DOIs
出版狀態Published - 30 十一月 2015

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