Design of high-performance and highly reliable nMOSFETs with embedded Si:C S/D extension stressor(Si:C S/D-E)

Steve S. Chung, E. R. Hsieh, P. W. Liu, W. T. Chiang, S. H. Tsai, T. L. Tsai, R. M. Huang, C. H. Tsai, W. Y. Teng, C. I. Li, T. F. Kuo, Y. R. Wang, C. L. Yang, C. T. Tsai, G. H. Ma, S. C. Chien, S. W. Sun

研究成果: Conference contribution同行評審

6 引文 斯高帕斯(Scopus)

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Engineering & Materials Science