Characterization of Pb(ScTa)1-xTixO3 (x<0.3) thin films grown on LaNiO3 coated Si By MOCVD

Chun-Hsiung Lin*, Hao-Chung Kuo, G. E. Stillman, Haydn Chen

*Corresponding author for this work

研究成果: Conference article同行評審

指紋 深入研究「Characterization of Pb(ScTa)<sub>1-x</sub>Ti<sub>x</sub>O<sub>3</sub> (x<0.3) thin films grown on LaNiO<sub>3</sub> coated Si By MOCVD」主題。共同形成了獨特的指紋。

Chemical Compounds

Engineering & Materials Science

Physics & Astronomy