Highly (100) textured pseudo-cubic Pb(ScTa)1-xTixO3 (x=0-0.3) (PSTT) thin films were grown by metal-organic chemical vapor deposition (MOCVD) on LaNiO3 (LNO) electrode buffered Si substrates at 650°C. The microstructure and chemical uniformity were studied using X-ray diffraction (XRD), scanning electron microscope (SEM), transmission electron microscope (TEM) and nanoprobe X-ray energy dispersive spectroscopy (EDS). The temperature dependence of dielectric properties and P-E behavior were measured. A shift of Curie temperature of these PST-based thin films due to Ti addition was demonstrated. Furthermore, the pyroelectric properties of these thin films were estimated.
|頁（從 - 到）||679-684|
|期刊||Materials Research Society Symposium - Proceedings|
|出版狀態||Published - 1 一月 1999|
|事件||Proceedings of the 1998 MRS Fall Meeting - The Symposium 'Advanced Catalytic Materials-1998' - Boston, MA, USA|
持續時間: 30 十一月 1998 → 3 十二月 1998