Characterization of device degradation of poly-si TFTs under dynamic operation with drain biased

Ya-Hsiang Tai*, Shih Che Huang, G. Lung Chan

*Corresponding author for this work

研究成果: Conference contribution同行評審

3 引文 斯高帕斯(Scopus)

指紋 深入研究「Characterization of device degradation of poly-si TFTs under dynamic operation with drain biased」主題。共同形成了獨特的指紋。

Engineering & Materials Science