Characterization of a burn-in failure caused by a defective source driver on TFT-LCD panel

Fred S.C. Wang*, Keh La Lin, Ko Yang Tso, Chin Chieh Chao, Wai William Wang, Alan Yu, C. Y. Lee, Chien Hung Kuo, C. W.Arex Wang, Yi Chiu

*Corresponding author for this work

研究成果: Conference contribution同行評審

摘要

This paper describes a thorough investigation to identify the root cause of an LCD panel burn-in failure induced by an LCD source driver, which is observed in a large-scale LCD factory producing more than one million LCD panels per month. The investigation demonstrates the effectiveness of the circuit simulation to precisely locate the defective spot which is caused by a metal slice originated from outer rings of an LCD COG (chip-on-glass) source driver. With the aid of emission microscope (EMMI), Energy Dispersive Analysis X-Ray (EDAX), and Chip Probing (CP) tester, the root cause of the failure is well explained. The formation mechanism of metal slice from the outer rings is thoroughly studied. A solution to completely eliminate the source of metal slices from the outer rings during wafer processing is also proposed.

原文English
主出版物標題Proceedings of 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2006
頁面171-174
頁數4
DOIs
出版狀態Published - 1 十二月 2006
事件13th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2006 - Singapore, Singapore
持續時間: 3 七月 20067 七月 2006

出版系列

名字Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Conference

Conference13th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2006
國家Singapore
城市Singapore
期間3/07/067/07/06

指紋 深入研究「Characterization of a burn-in failure caused by a defective source driver on TFT-LCD panel」主題。共同形成了獨特的指紋。

引用此