CDM ESD protection in CMOS integrated circuits

Ming-Dou Ker*, Yuan Wen Hsiao

*Corresponding author for this work

研究成果: Conference contribution同行評審

2 引文 斯高帕斯(Scopus)

指紋 深入研究「CDM ESD protection in CMOS integrated circuits」主題。共同形成了獨特的指紋。

Engineering & Materials Science