Automatic defect recognition of TFT array process using gray level co-occurrence matrix

Shih Wei Yang*, Chern Sheng Lin, Shir-Kuan Lin, Hsien Te Chiang

*Corresponding author for this work

研究成果: Article同行評審

17 引文 斯高帕斯(Scopus)

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Physics & Astronomy

Chemical Compounds

Engineering & Materials Science