An intelligent analysis of Iddq data for chip classification in very deep-submicron (VDSM) CMOS technology

Chia Ling Chang*, Chia Ching Chang, Hui Ling Chan, Charles H.P. Wen, Jayanta Bhadra

*Corresponding author for this work

研究成果: Conference contribution

9 引文 斯高帕斯(Scopus)

摘要

Iddq testing has been a critical integral component in test suites for screening unreliable devices. As the silicon technology keeps shrinking, Iddq values and their variation increase as well. Moreover, along with rapid design scaling, defect-induced leakage currents become less significant when compared to full-chip current and also make themselves less distinguishable. Traditional Iddq methods become less effective and cause more test escapes and yield loss. Therefore, in this paper, a new test method named σ-Iddq testing is proposed and integrates (1) a variation-aware full-chip leakage estimator and (2) a clustering algorithm to classify chip without using threshold values. Experimental result shows that σ-Iddq testing achieves a higher classification accuracy in a 45nm technology when compared to a single-threshold Iddq testing. As a result, both the process-variation and design-scaling impacts are successfully excluded and thus the defective chips can be identified intelligently.

原文English
主出版物標題ASP-DAC 2012 - 17th Asia and South Pacific Design Automation Conference
頁面163-168
頁數6
DOIs
出版狀態Published - 26 四月 2012
事件17th Asia and South Pacific Design Automation Conference, ASP-DAC 2012 - Sydney, NSW, Australia
持續時間: 30 一月 20122 二月 2012

出版系列

名字Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Conference

Conference17th Asia and South Pacific Design Automation Conference, ASP-DAC 2012
國家Australia
城市Sydney, NSW
期間30/01/122/02/12

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  • 引用此

    Chang, C. L., Chang, C. C., Chan, H. L., Wen, C. H. P., & Bhadra, J. (2012). An intelligent analysis of Iddq data for chip classification in very deep-submicron (VDSM) CMOS technology. 於 ASP-DAC 2012 - 17th Asia and South Pacific Design Automation Conference (頁 163-168). [6164938] (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC). https://doi.org/10.1109/ASPDAC.2012.6164938