An application of non-normal process capability indices

K. S. Chen, W.l. Pearn*

*Corresponding author for this work

研究成果: Article同行評審

44 引文 斯高帕斯(Scopus)


Numerous process capability indices, including Cp, Cpk, Cpm, and Cpmk, have been proposed to provide measures of process potential and performance. In this paper, we consider some generalizations of these four basic indices to cover non-normal distributions. The proposed generalizations are compared with the four basic indices. The results show that the proposed generalizations are more accurate than those basic indices and other generalizations in measuring process capability. We also consider an estimation method based on sample percentiles to calculate the proposed generalizations, and give an example to illustrate how we apply the proposed generalizations to actual data collected from the factory.

頁(從 - 到)355-360
期刊Quality and Reliability Engineering International
出版狀態Published - 1 一月 1997

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