Advanced soft-error-rate (ser) estimation with striking-time and multi-cycle effects

Ryan H.M. Huang, Charles H.P. Wen

研究成果: Conference contribution

9 引文 斯高帕斯(Scopus)

摘要

Soft error rate (SER) has become a critical reliability is- sue for CMOS designs due to continuous technology scaling. However, the striking-time and multi-cycle effects have not been properly considered in SER for advanced CMOS de- signs. Therefore, in this paper, the striking-time and multi- cycle effects are formulated into the problem of SER esti- mation, and then a SER analysis framework is proposed, accordingly. Experimental results show that SERs on the benchmark circuits are seriously underestimated when ig- noring both effects. Moreover, SERs increase more on those high-performance or low-power CMOS designs. New treat- ment to SER needs to be explored in the future.

原文English
主出版物標題DAC 2014 - 51st Design Automation Conference, Conference Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(列印)9781479930173
DOIs
出版狀態Published - 1 一月 2014
事件51st Annual Design Automation Conference, DAC 2014 - San Francisco, CA, United States
持續時間: 2 六月 20145 六月 2014

出版系列

名字Proceedings - Design Automation Conference
ISSN(列印)0738-100X

Conference

Conference51st Annual Design Automation Conference, DAC 2014
國家United States
城市San Francisco, CA
期間2/06/145/06/14

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