Accurate Statistical Soft Error Rate (SSER) analysis using a quasi-monte carlo framework with quality cell models

Yu Hsin Kuo*, Huan Kai Peng, Charles H.P. Wen

*Corresponding author for this work

研究成果: Conference contribution同行評審

23 引文 斯高帕斯(Scopus)

摘要

For CMOS designs in sub 90nm technologies, statistical methods are necessary to accurately estimate circuit SER considering process variations. However, due to the lack of quality statistical models, current statistical SER (SSER) frameworks have not yet achieved satisfactory accuracy. In this work, we present accurate table-based cell models, based on which a Monte Carlo SSER analysis framework is built. We further propose a heuristic to customize the use of quasirandom sequences, which successfully speeds up the convergence of simulation error and hence shortens the runtime. Experimental results show that this framework is capable of more precisely estimating circuit SSERs with reasonable speed.

原文English
主出版物標題Proceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010
頁面831-838
頁數8
DOIs
出版狀態Published - 28 五月 2010
事件11th International Symposium on Quality Electronic Design, ISQED 2010 - San Jose, CA, United States
持續時間: 22 三月 201024 三月 2010

出版系列

名字Proceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010

Conference

Conference11th International Symposium on Quality Electronic Design, ISQED 2010
國家United States
城市San Jose, CA
期間22/03/1024/03/10

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