Accurate and fast on-wafer test circuitry for device array characterization in wafer acceptance test

Hao-Chiao Hong*, Long Yi Lin

*Corresponding author for this work

研究成果: Article同行評審

1 引文 斯高帕斯(Scopus)

指紋 深入研究「Accurate and fast on-wafer test circuitry for device array characterization in wafer acceptance test」主題。共同形成了獨特的指紋。

Engineering & Materials Science