A scalable lossy substrate model for nanoscale RF MOSFET noise extraction and simulation adapted to various pad structures

Jyh-Chyurn Guo*, Y. H. Tsai

*Corresponding author for this work

研究成果: Conference contribution同行評審

5 引文 斯高帕斯(Scopus)

摘要

A broadband and scalable lossy substrate model is developed and validated for nanoscale RF MOSFETs of different finger numbers and adopting various pad structures such as lossy, normal, and small pads. The broadband accuracy is justified by good match with S- and Y-parameters up to 40 GHz. The measured noise characteristics in terms of four noise parameters can be accurately simulated up to 18 GHz. The scalable lossy substrate model can consistently predict the abnormally strong finger number dependence and nonlinear frequency response of noise figure (NFmin) revealed by the devices with lossy pads. Furthermore, the scalable model can precisely distribute the substrate loss between the transmission line (TML) and pads of various metal topologies and the resulted excess noises. The enhanced model provides useful guideline for appropriate layout of pads and TML to effectively reduce the excess noises. The remarkably suppressed noise figure to ideally intrinsic performance can be approached by the small pad in this paper.

原文English
主出版物標題Proceedings of the 2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007
頁面299-302
頁數4
DOIs
出版狀態Published - 2 十月 2007
事件2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007 - Honolulu, HI, United States
持續時間: 3 六月 20075 六月 2007

出版系列

名字Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium
ISSN(列印)1529-2517

Conference

Conference2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007
國家United States
城市Honolulu, HI
期間3/06/075/06/07

指紋 深入研究「A scalable lossy substrate model for nanoscale RF MOSFET noise extraction and simulation adapted to various pad structures」主題。共同形成了獨特的指紋。

引用此