A numerical model for simulating MOSFET gate current degradation by considering the interface state generation

C. M. Yih, Steve S. Chung, C. C.H. Hsu

研究成果: Conference contribution同行評審

2 引文 斯高帕斯(Scopus)

指紋 深入研究「A numerical model for simulating MOSFET gate current degradation by considering the interface state generation」主題。共同形成了獨特的指紋。

Mathematics

Engineering & Materials Science