A new method for simultaneous measurement of phase retardation and optical axis of a compensation film

Yung Hsun Wu*, Ju Hyun Lee, Yi-Hsin Lin, Hongwen Ren, Shin Tson Wu

*Corresponding author for this work

研究成果: Conference contribution同行評審

摘要

We demonstrate a new method for simultaneously measuring the phase retardation and optic axis of a compensation film by using an axially-symmetric sheared polymer network liquid crystal (AS-SPNLC). The ASSPNLC is a liquid crystal structure with radial director distribution and its phase retardation has a gradient change from center to edges. When overlaying a tested compensation film with a calibrated AS-SPNLC cell between crossed polarizers, the optic axis and phase retardation value of the compensation film can be determined. This method is particularly useful for those optical systems whose optic axis and phase retardation are dynamically changing.

原文English
主出版物標題Liquid Crystal Materials, Devices, and Applications XI
DOIs
出版狀態Published - 14 七月 2006
事件Liquid Crystal Materials, Devices, and Applications XI - San Jose, CA, United States
持續時間: 21 一月 200625 一月 2006

出版系列

名字Proceedings of SPIE - The International Society for Optical Engineering
6135
ISSN(列印)0277-786X

Conference

ConferenceLiquid Crystal Materials, Devices, and Applications XI
國家United States
城市San Jose, CA
期間21/01/0625/01/06

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