TY - JOUR
T1 - A classifying neural approach with principal component analysis for estimating job cycle time in a wafer fabrication factory
AU - Lin, Yu Cheng
AU - Chen, Tin-Chih
PY - 2012/12/13
Y1 - 2012/12/13
N2 - This study presents a classifying neural approach with principal component analysis (PCA) for estimating the cycle time of a job in a wafer fabrication factory, which is a critical task to the wafer fabrication factory. In the proposed methodology, PCA constructs a series of linear combinations of the original variables to form a new variable. Subsequently, a self-organization map (SOM) is used to classify jobs. For each category, an extreme learning machine (ELM) is constructed to estimate the cycle times of jobs. For evaluating the effectiveness of the proposed methodology, production simulation is also applied in this study to generate some test data.
AB - This study presents a classifying neural approach with principal component analysis (PCA) for estimating the cycle time of a job in a wafer fabrication factory, which is a critical task to the wafer fabrication factory. In the proposed methodology, PCA constructs a series of linear combinations of the original variables to form a new variable. Subsequently, a self-organization map (SOM) is used to classify jobs. For each category, an extreme learning machine (ELM) is constructed to estimate the cycle times of jobs. For evaluating the effectiveness of the proposed methodology, production simulation is also applied in this study to generate some test data.
KW - Cycle time
KW - Extreme learning machine
KW - Principal component analysis
KW - Self-organization map
KW - Wafer fabrication factory
UR - http://www.scopus.com/inward/record.url?scp=84870755743&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:84870755743
VL - 6
SP - 2751
EP - 2756
JO - ICIC Express Letters
JF - ICIC Express Letters
SN - 1881-803X
IS - 11
ER -