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查看斯高帕斯 (Scopus) 概要
吳 添立
助理教授, MediaTek Junior Chair Professor
智慧半導體奈米系統技術研究中心
國際半導體產業學院
https://orcid.org/0000-0001-6788-5470
電話
035712121#59442
電子郵件
tlwu@nctu.edu.tw
網站
https://wlabnctu.wixsite.com/wlabnctu
2009
2020
每年研究成果
概覽
指紋
網路
計畫
(5)
研究成果
(50)
獎項
(5)
類似的個人檔案
(11)
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指紋
查看啟用 Tian-Li Wu 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
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Engineering & Materials Science
High electron mobility transistors
Gate dielectrics
Management information systems
Electric breakdown
Semiconductor materials
Metals
Threshold voltage
Substrates
Ferroelectric materials
Degradation
Aluminum oxide
Electric potential
Temperature
Transistors
Atomic layer deposition
Plasmas
Interface states
Annealing
Field effect transistors
Hafnium
Ohmic contacts
Hot electrons
Junction gate field effect transistors
Irradiation
Gamma rays
Leakage currents
Electrons
Weibull distribution
Capacitance
Shielding
Heterojunctions
Chemical vapor deposition
Ferroelectric devices
Two dimensional electron gas
Luminescence
Ytterbium
Power HEMT
Electroluminescence
Voltage measurement
Activation energy
Schottky barrier diodes
Hysteresis
Capacitors
Ferroelectricity
Physics
Polarization
Chemical Compounds
aluminum gallium nitride
High electron mobility transistors
Management information systems
Metals
Semiconductor materials
Threshold voltage
Gate dielectrics
Hafnium
Ferroelectric materials
Annealing
Ohmic contacts
Hot electrons
Degradation
Aluminum oxide
Irradiation
Gamma rays
Temperature
Atomic layer deposition
Substrates
Electric potential
Leakage currents
Heterojunctions
Plasmas
Ferroelectric devices
Ytterbium
Electric breakdown
Two dimensional electron gas
Interface states
Power HEMT
silicon nitride
Capacitors
Junction gate field effect transistors
Electrons
Transistors
zirconium oxide
Aluminum Oxide
Physics & Astronomy
high electron mobility transistors
MIS (semiconductors)
trapping
threshold voltage
field effect transistors
traps
shift
atomic layer epitaxy
degradation
hot electrons
leakage
insulators
hafnium oxides
transistors
irradiation
capacitance
borders
