每年專案
個人檔案
研究專長
Single event effect (SEE) in semiconductor devices
Electrostatic discharge (ESD) and transient voltage suppressors (TVS)
教育/學術資格
PhD, The University of Tokyo
指紋
查看啟用 Chin-Han Chung 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。
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專案
研究成果
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Understanding the Difference in Soft-Error Sensitivity of Back-Biased Thin-BOX SOI SRAMs to Space and Terrestrial Radiation
Chung, C. H., Kobayashi, D. & Hirose, K., 十二月 2019, 於: IEEE Transactions on Device and Materials Reliability. 19, 4, p. 751-756 6 p., 8882369.研究成果: Article › 同行評審
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Resistance-Based Modeling for Soft Errors in SOI SRAMs Caused by Radiation-Induced Potential Perturbation under the BOX
Chung, C. H., Kobayashi, D. & Hirose, K., 十二月 2018, 於: IEEE Transactions on Device and Materials Reliability. 18, 4, p. 574-582 9 p., 8477021.研究成果: Article › 同行評審
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Threshold ion parameters of line-type soft-errors in biased thin-BOX SOI SRAMs: Difference between sensitivities to terrestrial and space radiation
Chung, C., Kobayashi, D. & Hirose, K., 25 五月 2018, 2018 IEEE International Reliability Physics Symposium, IRPS 2018. Institute of Electrical and Electronics Engineers Inc., p. 4C.31-4C.36 (IEEE International Reliability Physics Symposium Proceedings; 卷 2018-March).研究成果: Conference contribution › 同行評審
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Mechanism behind Long Line-Type MCUs in Thin-BOX SOI SRAMs: Resistance-Based Modeling and Countermeasure
Chung, C. H., Kobayashi, D. & Hirose, K., 2 七月 2017, 2017 17th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2017. Institute of Electrical and Electronics Engineers Inc., 8696168. (2017 17th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2017).研究成果: Conference contribution › 同行評審