Zirconia nucleating agent on microstructural and electrical properties of a CaMgSi 2 O 6 diopside glass-ceramic for microwave dielectrics

Kuei Chih Feng*, Chen Chia Chou, Li Wen Chu, H. D. Chen

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

25 Scopus citations

Abstract

Addition of different amount of zirconia (ZrO 2 ) nucleating agent into MgO-CaO-SiO 2 system to enhance the quality factor (Q × f) of CaMgSi 2 O 6 diopside glass-ceramic for low sintering temperature process (from 850 to 950 °C) was carried out in this work. The microstructures, microwave dielectric properties and nucleating/growth mechanism of m-ZrO 2 added CaMgSi 2 O 6 system were analyzed using transmission electron microscopy (TEM) and electrical property measurements. Experimental results demonstrate that a solid solution of an amorphous phase MgO-CaO-SiO 2 and ZrO 2 forms after melted at 1500 °C. The t-ZrO 2 appears in the amorphous matrix first and then crystalline CaMgSi 2 O 6 particle grows up at around the boundary of t-ZrO 2 after thermal treatment at 850 °C due to heterogeneous nucleating. Formation of t-ZrO 2 is attributed to diffusion of Ca 2+ to stabilize the m-ZrO 2 . The quality factor of CaMgSi 2 O 6 was significantly enhanced by adding 3 wt.% m-ZrO 2 , indicating that the ZrO 2 nucleating agent could enhance crystallization and therefore increase the quality factor.

Original languageEnglish
Pages (from-to)2851-2855
Number of pages5
JournalMaterials Research Bulletin
Volume47
Issue number10
DOIs
StatePublished - 1 Oct 2012

Keywords

  • A. Ceramics
  • A. Glasses
  • C. Electron microscopy
  • D. Dielectric properties
  • D. Microstructure

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