X-ray scattering study of Ag/Si(111) buried interface structures

Hawoong Hong*, R. D. Aburano, D. S. Lin, H. D. Chen, T. C. Chiang, P. Zschack, E. D. Specht

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

53 Scopus citations

Abstract

Various interface structures formed between Si(111) and a thick Ag overlayer are investigated by grazing-incidence x-ray diffraction. The (7×7) reconstruction of Si(111) is preserved under a room-temperature deposited Ag film. Upon annealing to 250°C the interface becomes (1×1). This is contrasted by the (3 × 3) R30°structure formed by annealing a thin Ag film on Si(111). By depositing a thick Ag film on this (3 × 3) R30°Ag/Si(111) surface at room temperature, the (3 × 3) R30°reconstruction is suppressed.

Original languageEnglish
Pages (from-to)507-510
Number of pages4
JournalPhysical Review Letters
Volume68
Issue number4
DOIs
StatePublished - 1 Jan 1992

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