X-ray inspection image enhencement using shearlet transform

Sheng-Fuu Lin*, Tung Ying Wu, Yu Bi Hong

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In automatic X-ray inspection, to denoise and enhance characteristics is a very important issue for application, especially the images used to inspect the wires in chips. Because the methods used to enhance or denoise may degrade the characteristic of the wires which can be seen as curves such that the efficiency is not enough. Shearlet has been approved of its perfect performance on curve description. In this paper, the method is applied and the method of coefficient modification is used. As a result, it shows that the wires are effectively enhanced while the noise is also attenuated.

Original languageEnglish
Title of host publicationProceedings of the 2012 7th IEEE Conference on Industrial Electronics and Applications, ICIEA 2012
Pages1763-1767
Number of pages5
DOIs
StatePublished - 1 Dec 2012
Event2012 7th IEEE Conference on Industrial Electronics and Applications, ICIEA 2012 - Singapore, Singapore
Duration: 18 Jul 201220 Jul 2012

Publication series

NameProceedings of the 2012 7th IEEE Conference on Industrial Electronics and Applications, ICIEA 2012

Conference

Conference2012 7th IEEE Conference on Industrial Electronics and Applications, ICIEA 2012
CountrySingapore
CitySingapore
Period18/07/1220/07/12

Keywords

  • X-ray
  • shearlet transform inspection

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