Waveguide measurement technique for complex permittivity of materials with high or low losses

Yuki Konishi*, Teppei Kobata, Kotaro Momoeda, Kikuo Wakino, Ying-Dar Lin, Toshihide Kitazawa

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A novel evaluation method for variety of the dielectric materials with low or high losses is reported. The proposed evaluation method is based on the hybrid numerical method [1] combining the extended spectral domain approach with mode-matching method. This does not include any approximation unlike in the case of the perturbation scheme. The sample may be a columnar structure with the arbitrarily cross section and electrically large or small, and it is placed at arbitrarily position in the waveguide. The size of sample is chosen properly so as to achieve the adequate accuracy of the scattering parameters S21 measurements with TE01 mode. For example, the smaller sample should be prepared for the material with high permittivity and/or high loss and it should be placed near to the waveguide wall where the electric field is weaker than in the center for TE01 mode.

Original languageEnglish
Title of host publication2012 Asia-Pacific Microwave Conference, APMC 2012 - Proceedings
Pages1316-1318
Number of pages3
DOIs
StatePublished - 1 Dec 2012
Event2012 Asia-Pacific Microwave Conference, APMC 2012 - Kaohsiung, Taiwan
Duration: 4 Dec 20127 Dec 2012

Publication series

NameAsia-Pacific Microwave Conference Proceedings, APMC

Conference

Conference2012 Asia-Pacific Microwave Conference, APMC 2012
CountryTaiwan
CityKaohsiung
Period4/12/127/12/12

Keywords

  • hybrid electromagnetic method
  • material evaluation
  • waveguide

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