Voltage Transfer Characteristic Matching by Different Nanosheet Layer Numbers of Vertically Stacked Junctionless CMOS Inverter for SoP/3D-ICs applications

P. J. Sung, C. Y. Chang, L. Y. Chen, K. H. Kao, C. J. Su, T. H. Liao, C. C. Fang, C. J. Wang, T. C. Hong, C. Y. Jao, H. S. Hsu, S. X. Luo, Y. S. Wang, H. F. Huang, J. H. Li, Y. C. Huang, F. K. Hsueh, C. T. Wu, Y. M. Huang, F. J. HouG. L. Luo, Y. C. Huang, Y. L. Shen, W. C.Y. Ma, K. P. Huang, K. L. Lin, S. Samukawa, Y. Li, G. W. Huang, Y. J. Lee, J. Y. Li, W. F. Wu, J. M. Shieh, Tien-Sheng Chao, W. K. Yeh, Y. H. Wang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

For the first time, CMOS inverters with different numbers of vertically stacked junctionless (JL) nanosheets (NSs) are demonstrated. All fabrication steps were below 600 °C, and 8-nm thick poly-Si NSs with smooth surface roughness were formed by a dry etching process. Compared to single channel devices, stacked n/p-channel FETs exhibit higher on-current with low leakage current. Furthermore, a common-gate process was performed for the fabrication of CMOS inverters. By adjusting the NS layer numbers for n/pFETs, respectively, the voltage transfer characteristics (VTCs) of the CMOS inverter can be matched much better to reduce the noise margin due to on-current matching without area penalty. This work experimentally demonstrates a new configuration of CMOS inverters on stacked NSs, which is promising for System-on-Panel (SoP) and 3D-ICs applications.

Original languageEnglish
Title of host publication2018 IEEE International Electron Devices Meeting, IEDM 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages21.4.1-21.4.4
ISBN (Electronic)9781728119878
DOIs
StatePublished - 16 Jan 2019
Event64th Annual IEEE International Electron Devices Meeting, IEDM 2018 - San Francisco, United States
Duration: 1 Dec 20185 Dec 2018

Publication series

NameTechnical Digest - International Electron Devices Meeting, IEDM
Volume2018-December
ISSN (Print)0163-1918

Conference

Conference64th Annual IEEE International Electron Devices Meeting, IEDM 2018
CountryUnited States
CitySan Francisco
Period1/12/185/12/18

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