VIA-5 Hot-Electron Induced Excess Carriers in n-Channel MOSFETs

S. Tam, P. Ko, F. C. Hsu, Chen-Ming Hu, R. S. Muller

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)1703-1704
Number of pages2
JournalIEEE Transactions on Electron Devices
Volume29
Issue number10
DOIs
StatePublished - 1 Jan 1982

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