VIA-4 Avalanche-Induced Breakdown Mechanisms in Short-Channel MOSFETs

F. C. Hsu, P. K. Ko, S. Tam, Chen-Ming Hu, R. S. Muller

Research output: Contribution to journalArticle

6 Scopus citations
Original languageEnglish
Pages (from-to)1702-1703
Number of pages2
JournalIEEE Transactions on Electron Devices
Volume29
Issue number10
DOIs
StatePublished - 1 Jan 1982

Cite this