Very fast simulated annealing for pattern detection and seismic applications

Kou-Yuan Huang*, Yueh Hsun Hsieh

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

10 Scopus citations

Abstract

We use three global optimization methods in the pattern parameter detection system, including simulated annealing (SA), fast simulated annealing (FSA) and very fast simulated annealing (VFSA). The sequential pattern parameter detection system can detect three types of patterns that include the lines, hyperbolas and ellipses in image. We use steps in the parameter detection for reducing the computation and getting fast convergence. This system has the capability of searching pattern parameter vectors with global minimal distance between the patterns and the image data. After the system is successful in image pattern detection, we apply it to detect the parameters of the hyperbolic patterns on real one-shot seismogram and seismic common depth point (CDP) gather data. This procedure provides an automatic velocity analysis method and improves the seismic interpretation and further seismic data processing.

Original languageEnglish
Title of host publication2011 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2011 - Proceedings
Pages499-502
Number of pages4
DOIs
StatePublished - 16 Nov 2011
Event2011 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2011 - Vancouver, BC, Canada
Duration: 24 Jul 201129 Jul 2011

Publication series

NameInternational Geoscience and Remote Sensing Symposium (IGARSS)

Conference

Conference2011 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2011
CountryCanada
CityVancouver, BC
Period24/07/1129/07/11

Keywords

  • common depth point(CDP)
  • fast simulated annealing
  • simulated annealing
  • velocity analysis
  • very fast simulated annealing

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