Variations of differential capacitance in SrBi 2 Ta 2 O 9 ferroelectric films induced by photoperturbation

Ching Chich Leu*, Chao-Hsin Chien, Chih Yuan Chen, Mao Nan Chang, Fan Yi Hsu, Chen Ti Hu, Yung-Fu Chen

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

In this letter, we demonstrated the impact of illumination on the differential capacitance variation of a strontium bismuth tantalite (SBT) capacitor during scanning capacitance microscopy measurements. It was found that illumination with a stray light of laser in an atomic force microscope could perturb the dC/dV signals of the samples. We attribute this phenomenon to the generation of free carriers by the photon absorptions via defect traps in the SBT thin film. Therefore, this present work suggests that the effect of laser illumination must be carefully taken into consideration whenever a field-sensitive technique is employed to analyze the properties of a ferroelectric material.

Original languageEnglish
Article number092906
Pages (from-to)1-3
Number of pages3
JournalApplied Physics Letters
Volume86
Issue number9
DOIs
StatePublished - 28 Feb 2005

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