Variable temperature measurement on operating pentacene-based OTFT

Hung Keng Chen*, Po-Tsun Liu, Ting Chang Chang, S. L. Shy

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

Variable temperature electrical measurement is well-established and used for determining the conduction mechanism in semiconductors. There is a Meyer-Neldel relationship between the activation energy and the prefactor with a Meyer - Neldel energy of 30.03 meV, which corresponds well with the isokinetic temperature of about 350 K. Therefore, the multiple trapping and release model is properly used to explain the thermally activated phenomenon. By the method, an exponential distribution of traps is assumed to be a better representation of trap states in band tail. Samples with higher temperature during measurement are observed to show better mobility, higher on-current and lower resistance, which agree well with the multiple trapping and release model proposed to explain the conduction mechanism in pentacene-based OTFTs.

Original languageAmerican English
Title of host publicationConjugated Organic Materials-Synthesis, Structure, Device and Applications
PublisherMRS Online Proceedings Library
Pages176-181
Number of pages6
Volume1091
ISBN (Print)9781605608440
DOIs
StatePublished - 1 Oct 2008
Event2008 MRS Spring Meeting - San Francisco, CA, United States
Duration: 24 Mar 200828 Mar 2008

Publication series

NameMaterials Research Society Symposium Proceedings
Volume1091
ISSN (Print)0272-9172

Conference

Conference2008 MRS Spring Meeting
CountryUnited States
CitySan Francisco, CA
Period24/03/0828/03/08

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