Untangling Coupled Order Parameters at Complex Oxide Interfaces with Aberration-Corrected STEM and EELS

A. Y. Borisevich, Y. M. Kim, M. P. Oxley, A. Morozovska, E. Eliseev, Ying-hao Chu, P. Yu, S. J. Pennycook, S. V. Kalinin

Research output: Contribution to journalArticlepeer-review

1 Scopus citations
Original languageEnglish
Pages (from-to)318-319
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
DOIs
StatePublished - 1 Jan 2012

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