Ultrathin limit of exchange bias coupling at oxide multiferroic/ ferromagnetic interfaces

M. Huijben*, P. Yu, L. W. Martin, H. J.A. Molegraaf, Ying-hao Chu, M. B. Holcomb, N. Balke, G. Rijnders, R. Ramesh

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

45 Scopus citations

Abstract

Exchange bias coupling at the multiferroic- ferromagnetic interface in BiFeO 3 /La 0.7 Sr 0.3 MnO 3 heterostructures exhibits a critical thickness for ultrathin BiFeO 3 layers of 5 unit cells (2 nm). Linear dichroism measurements demonstrate the dependence on the BiFeO 3 layer thickness with a strong reduction for ultrathin layers, indicating diminished antiferromagnetic ordering that prevents interfacial exchange bias coupling.

Original languageEnglish
Pages (from-to)4739-4745
Number of pages7
JournalAdvanced Materials
Volume25
Issue number34
DOIs
StatePublished - 14 Sep 2013

Keywords

  • exchange bias
  • ferromagnet
  • interface
  • multiferroic
  • oxide heterostructure

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