Ultrathin limit and dead-layer effects in local polarization switching of BiFeO 3

Peter Maksymovych*, Mark Huijben, Minghu Pan, Stephen Jesse, Nina Balke, Ying-hao Chu, Hye Jung Chang, Albina Y. Borisevich, Arthur P. Baddorf, Guus Rijnders, Dave H.A. Blank, Ramamoorthy Ramesh, Sergei V. Kalinin

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

48 Scopus citations

Abstract

Using piezoresponse force microscopy in an ultrahigh vacuum, polarization switching has been detected and quantified in epitaxial BiFeO 3 films from 200 to about 4 unit cells thick. Local remnant piezoresponse was utilized to probe both ferroelectric properties and effects of imperfect electrical contacts. It was found that the shape of electromechanical hysteresis loops is strongly influenced by an extrinsic dielectric gap, primarily through the suppressing effect of the depolarizing field on the spontaneous polarization in the ultrathin films. Furthermore, statistical analysis of the hysteresis loops has revealed lateral variation of the extrinsic dielectric gap with sub-10-nm resolution. Robust and reproducible ferroelectric properties of nanoscale BiFeO 3 indicate its potential for nanoscale applications in information storage and spintronics.

Original languageEnglish
Article number014119
Number of pages8
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume85
Issue number1
DOIs
StatePublished - 31 Jan 2012

Fingerprint Dive into the research topics of 'Ultrathin limit and dead-layer effects in local polarization switching of BiFeO <sub>3</sub>'. Together they form a unique fingerprint.

Cite this