Tunneling in sub-5 nm La2O3 films deposited by E-beam evaporation

E. Miranda*, J. Molina, Y. Kim, H. Iwai

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

We investigate the leakage current in ultrathin (sub-5 nm) La 2O3 dielectric films deposited on n-Si (1 0 0) substrates by electron-beam evaporation and annealed in situ in ultra-high vacuum conditions. We show that simple tunneling models both for the direct and Fowler-Nordheim conduction regimes can accurately reproduce the measured current-voltage characteristics over a wide voltage range. In the latter regime, it is shown the importance of considering the series resistance effect to account for the shape of the characteristics. We propose a method to obtain the series resistance's value based on the linearization of the Fowler-Nordheim plot. Some experimental features in combination with an exploratory analysis of the fitting parameters seem to indicate that the current flow through the structure is mostly localized, which is attributed to the existence of thickness non-uniformities in the oxide layer. In addition, we show that the application of electrical stress creates traps or defects within the insulator that leads to a progressive increase of the leakage current and to a change of the dominant conduction mechanism at the lowest biases.

Original languageEnglish
Pages (from-to)92-97
Number of pages6
JournalJournal of Non-Crystalline Solids
Volume352
Issue number1
DOIs
StatePublished - 1 Jan 2006

Keywords

  • Electrical and electronic properties
  • Films and coatings
  • Vapor phase deposition

Fingerprint Dive into the research topics of 'Tunneling in sub-5 nm La<sub>2</sub>O<sub>3</sub> films deposited by E-beam evaporation'. Together they form a unique fingerprint.

Cite this