Transient-to-digital converter to detect electrical fast transient (EFT) disturbance for system protection design

Cheng Cheng Yen*, Wan Yen Lin, Ming-Dou Ker, Ching Ling Tsai, Shih Fan Chen, Tung Yang Chen

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

A new on-chip 4-bit transient-to-digital converter for electrical fast transient (EFT) protection design has been proposed. The converter is designed to detect EFT-induced transient disturbances and transfer different EFT voltages into digital codes under EFT tests. The experimental results in silicon chip have confirmed the successful digital output codes.

Original languageEnglish
Title of host publication2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011
DOIs
StatePublished - 24 Jun 2011
Event2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011 - Kaohsiung, Taiwan
Duration: 2 May 20114 May 2011

Publication series

Name2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011

Conference

Conference2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011
CountryTaiwan
CityKaohsiung
Period2/05/114/05/11

Keywords

  • Electrical fast transient (EFT) test
  • Electromagnetic compatibility (EMC)
  • Transient detection circuit
  • Transient-to-digital converter

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