Transient-to-digital converter for ESD protection design in microelectronic systems

Ming-Dou Ker*, Cheng Cheng Yen, Chi Sheng Liao, Tung Yang Chen, Chih Chung Tsai

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

An on-chip transient-to-digital converter for system-level electrostatic discharge (ESD) protection is proposed. The proposed transient-to-digital converter is designed to detect fast electrical transients during the system-level ESD events. The output digital thermometer codes can correspond to different ESD voltages under system-level ESD tests. The experimental results in a 0.18-μm CMOS integrated circuit (IC) with 3.3-V devices have confirmed the detection function and digital output codes.

Original languageEnglish
Title of host publicationProceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008
Pages409-412
Number of pages4
DOIs
StatePublished - 1 Dec 2008
Event2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008 - Fukuoka, Japan
Duration: 3 Nov 20085 Nov 2008

Publication series

NameProceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008

Conference

Conference2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008
CountryJapan
CityFukuoka
Period3/11/085/11/08

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