Transient device simulation of trap-assisted leakage in non-volatile memory cell

Hiroshi Watanabe*

*Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

1 Scopus citations

Fingerprint Dive into the research topics of 'Transient device simulation of trap-assisted leakage in non-volatile memory cell'. Together they form a unique fingerprint.

Mathematics

Engineering & Materials Science