Transient detection circuit for system-level ESD protection and its on-board behavior with EMI/EMC filters

Ming-Dou Ker, Chi Sheng Liao, Cheng Cheng Yen

Research output: Contribution to journalConference article

4 Scopus citations

Abstract

A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is proposed. The circuit performance of detecting fast electrical transients has been verified in a 0.18-μm CMOS integrated circuit (IC). The experimental results have confirmed that the proposed on-chip transient detection circuit can detect positive and negative fast electrical transients during system-level ESD zapping. Three board-level noise filtering networks have been investigated their enhancement on detection range of the proposed on-chip transient detection circuit. The chip-level solution can be further co-designed with the board-level solution in order to meet high system-level ESD specification.

Original languageEnglish
Article number4652088
JournalIEEE International Symposium on Electromagnetic Compatibility
Volume2008-January
DOIs
StatePublished - 1 Jan 2008
Event2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 - Detroit, MI, Germany
Duration: 18 Aug 200822 Aug 2008

Keywords

  • Detection circuit
  • Electrostatic discharge (ESD)
  • ESD protection circuit
  • System-level ESD test

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