Transconductance distribution in program/erase cycling of NAND flash memory devices: A statistical investigation

Yung Yueh Chiu*, I. Chun Lin, Kai Chieh Chang, Bo Jun Yang, Toshiaki Takeshita, Masaru Yano, Riichiro Shirota

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

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Chemical Compounds

Engineering & Materials Science