Erratum: Total-Dose Effect of X-ray Irradiation on Low-TemperaturePolycrystalline Silicon Thin-Film Transistors (IEEE Electron Device Letters (2020) 41:6 (864–867) DOI: 10.1109/LED.2020.2988879)

Ya-Hsiang Tai, Shan Yeh*, Shih-Hsuan Huang, Ting-Chang Chang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

In The above article [1], the Acknowledgment was deleted in error. Therefore, the Acknowledgment is added below. This change had no influence on the discussion and conclusions in the article. ACKNOWLEDGMENT This research was supported by Southern Taiwan Science Park Bureau, Ministry of Science and Technology, Taiwan, R.O.C., under Contract 108CE01.

Original languageEnglish
Article number9178392
Pages (from-to)1448-1448
Number of pages1
JournalIeee Electron Device Letters
Volume41
Issue number9
DOIs
StatePublished - Sep 2020

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