Topology-driven cell layout migration with collinear constraints

De Shiun Fu*, Ying Zhih Chaung, Yen Hung Lin, Yih-Lang Li

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

7 Scopus citations

Abstract

Traditional layout migration focuses on area minimization, thus suffered wire distortion, which caused loss of layout topology. A migrated layout inheriting original topology owns original design intention and predictable property, such as wire length which determines the path delay importantly. This work presents a new rectangular topological layout to preserve layout topology and combine its flexibility of handling wires with traditional scan-line based compaction algorithm for area minimization. The proposed migration flow contains devices and wires extraction, topological layout construction, unidirectional compression combining scan-line algorithm with collinear equation solver, and wire restoration. Experimental results show that cell topology is well preserved, and a several times runtime speedup is achieved as compared with recent migration research based on ILP (integer linear programming) formulation.

Original languageEnglish
Title of host publication2009 IEEE International Conference on Computer Design, ICCD 2009
Pages439-444
Number of pages6
DOIs
StatePublished - 1 Dec 2009
Event2009 IEEE International Conference on Computer Design, ICCD 2009 - Lake Tahoe, CA, United States
Duration: 4 Oct 20097 Oct 2009

Publication series

NameProceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors
ISSN (Print)1063-6404

Conference

Conference2009 IEEE International Conference on Computer Design, ICCD 2009
CountryUnited States
CityLake Tahoe, CA
Period4/10/097/10/09

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