Time-Resolved Carrier Dynamics near the Insulator - Metal Transition

M. J. Feldstein*, C. D. Keating, W. Zheng, Ian Liau, A. G. MacDiarmid, Michael J. Natan, N. F. Scherer

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations


Carrier dynamics in polyaniline and colloidal Au films have been examined using a combined approach of time resolved laser spectroscopy and atomic force microscopy (AFM) These systems exhibit insulator-metal transitions (IMT) in conjunction with synthetic modification of their structure The relationship between structure and reactivity, in terms of hot carrier lifetimes and transport, has been identified by correlating changes in the dynamics with the directly measured morphology. Physical insight into the processes affecting carrier lifetimes and localization and the nature of the IMT has been derived from an analysis of the experimental data. The results and conclusions presented herein have implications for directing research and development in device applications based on thin film technologies.

Original languageEnglish
Pages (from-to)141-151
Number of pages11
JournalACS Symposium Series
StatePublished - 1 Dec 1997

Fingerprint Dive into the research topics of 'Time-Resolved Carrier Dynamics near the Insulator - Metal Transition'. Together they form a unique fingerprint.

Cite this