Time-Correlated Crosstalk Measurements between CMOS Single-Photon Avalanche Diodes

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We investigate time-resolved crosstalk probability between single-photon avalanche diodes in CMOS technology. The time-correlated crosstalk measurements reveal an unusual double-peak feature. This behavior becomes more significant at higher excess bias voltages and shorter device-To-device distance and its physical reason will be discussed.

Original languageEnglish
Title of host publicationInternational Conference on Optical MEMS and Nanophotonics, OMN 2018 - Proceedings
PublisherIEEE Computer Society
ISBN (Print)9781509063727
DOIs
StatePublished - 4 Sep 2018
Event23rd International Conference on Optical MEMS and Nanophotonics, OMN 2018 - Lausanne, Switzerland
Duration: 29 Jul 20182 Aug 2018

Publication series

NameInternational Conference on Optical MEMS and Nanophotonics
Volume2018-July
ISSN (Print)2160-5033
ISSN (Electronic)2160-5041

Conference

Conference23rd International Conference on Optical MEMS and Nanophotonics, OMN 2018
CountrySwitzerland
CityLausanne
Period29/07/182/08/18

Keywords

  • breakdown flash
  • CMOS technology
  • crosstalk
  • Single-photon avalanche diodes
  • time correlation

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  • Cite this

    Wu, D. R., Tsai, C-M., & Lin, S-D. (2018). Time-Correlated Crosstalk Measurements between CMOS Single-Photon Avalanche Diodes. In International Conference on Optical MEMS and Nanophotonics, OMN 2018 - Proceedings [8454598] (International Conference on Optical MEMS and Nanophotonics; Vol. 2018-July). IEEE Computer Society. https://doi.org/10.1109/OMN.2018.8454598